The RINDO HR Series 65M Multi-Light System elevates high-precision 3D inspection capabilities to new heights with an industry-leading 65 million point cloud data volume. While achieving ultra-large field of view coverage, the system maintains micron-level accuracy, effectively addressing the industry challenge of balancing high resolution and wide field of view.
Boasting ultra-high-resolution imaging performance, this series can clearly capture subtle features such as the coplanarity of solder balls on large-size BGA chips and the wire bond loop height of IGBT aluminum wires. It supports full-field precision measurement of solder ball height, diameter, offset, and wire loop profile, providing reliable 3D data support for semiconductor packaging and power module inspection.