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Rindo HR Series 65M Multi-Light System
The RINDO HR Series 65M Multi-Light System elevates high-precision 3D inspection capabilities to new heights with an industry-leading 65 million point cloud data volume. While achieving ultra-large field of view coverage, the system maintains micron-level accuracy, effectively addressing the industry challenge of balancing high resolution and wide field of view.
Boasting ultra-high-resolution imaging performance, this series can clearly capture subtle features such as the coplanarity of solder balls on large-size BGA chips and the wire bond loop height of IGBT aluminum wires. It supports full-field precision measurement of solder ball height, diameter, offset, and wire loop profile, providing reliable 3D data support for semiconductor packaging and power module inspection.
Features
  • Industry-leading resolution of 9344×7000 enables meticulous detail reproduction;
  • Balancing high precision with a large field of view, it effectively meets the dual demands of precision inspection and efficiency;
  • Specialized optimization for scenarios such as BGA chip and IGBT aluminum wire inspection enhances detection reliability;
  • Full independent R&D of core components ensures independent control of system performance and continuous upgrade capability.
DLP
All 1280×720 912×1140 1920×1080
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CMOS Resolution
All 3M 5M 12M 25M 65M
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Xy Resolution
All <5μm <10μm <20μm <50μm <100μm <500μm <1000μm
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Z-Axis Repeatability
All <5μm <10μm <20μm <50μm <100μm <500μm <1000μm
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Frame Rate
All <=2.5 <=7.5 <=15
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Light Source
All Default White Light Default Blue Light
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Interface
All GigE USB_3.0 CXP
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