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RINDO HRDOF Series
The RINDO HRDOF Series introduces the new 21M model, which retains the series' ultra-depth-of-field technology advantages while further expanding single-acquisition field of view coverage. This achieves a synergistic improvement in both large FOV and high precision, significantly increasing inspection throughput per unit time.
Suitable for high-precision 3D inspection of semiconductor wire bonding—including gold wire loop profiles and solder ball morphology—the model's expanded large FOV capability also enables efficient dimensional measurement and appearance inspection of precision 3C components (such as curved surface profile tolerance and complex geometries), providing flexible vision solutions for precision manufacturing across multiple industries.
Features
  • Upgraded Inspection Speed – Engineered for high-speed inline detection
  • Algorithm Optimization – Significantly enhanced Z-axis repeatability
  • Ultra-Large Depth of Field – Stable performance on complex surfaces
  • Application-Optimized – Specifically tailored for semiconductor wire bonding and precision component dimensional measurement
DLP
All 1280×720 912×1140 1920×1080
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CMOS Resolution
All 3M 5M 12M 25M 65M
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Xy Resolution
All <5μm <10μm <20μm <50μm <100μm <500μm <1000μm
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Z-Axis Repeatability
All <5μm <10μm <20μm <50μm <100μm <500μm <1000μm
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Frame Rate
All <=2.5 <=7.5 <=15
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Light Source
All Default White Light Default Blue Light
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Interface
All GigE USB_3.0 CXP
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